What's New At CyberOptics Semiconductor
CyberOptics Semiconductor to feature revolutionary wireless measurement systems for leveling, gapping, teaching and detecting vibration in semiconductor equipment at Semicon West, July 15-17, 2008 in San Francisco, North Hall, booth #6461.
CyberOptics Semiconductor will sponsor the Equipment Productivity Session at ASMC 2008, May 5-7 at the Hyatt Regency in Cambridge, Massachusetts. The equipment productivity session will address the challenges of current and future semiconductor process technologies requiring a higher level of equipment reliability, quality, repeatability and productivity. Optimizing equipment performance will help minimize wafer costs and maximize competitiveness. Papers in this session will review ideas and successes to help optimize equipment utilization and performance. Please see page 4 of the online program for additional information.
CyberOptics Semiconductor to feature WaferSense™ products at the
9th European Advanced Equipment Control/Advanced Process Control (AEC/APC) Conference (Mar 31-Apr 2, 2008,
Hotel David Intercontinental, Tel-Aviv, Israel
)
CyberOptics Semiconductor will demonstrate
its WaferSense ALS and WaferSense ALS2 Auto Leveling Systems and WaferSense ATS Auto Teaching System at the upcoming
AEC/APC Europe. Visit http://www.aecapc-europe.com for additional information. In addition CyberOptics Semiconductor, Inc. will participate in the AEC/APC Conference poster session with a presentation on "Improving Tool Repeatability, Process Control and Predictive Maintenance Using Precision
Wireless Sensing Technology"
CyberOptics Semiconductor to feature revolutionary wireless measurement systems for leveling, gapping, teaching and detecting vibration in semiconductor equipment at SPIE Advanced Lithography, February 26-27, 2008 in San Jose, booth #214.
CyberOptics Semiconductor to feature new WaferSense™ AVS Auto Vibration System at Semicon Japan (Dec 5-7, Makuhari Messe, Chiba, Japan)
CyberOptics Semiconductor will demonstrate its newest WaferSense products at SEMICON Japan in Hall 7, Booth
7D-915, including the just-introduced WaferSense AVS Auto Vibration System, designed to detect wafer-damaging vibrations. Additional product demonstrations include WaferSense ALS2 Vertical Auto Leveling System, WaferSense AGS 300 Auto Gapping System and WaferSense ATS Auto Teaching System. Please visit www.semiconjapan.org to learn more about SEMICON Japan and to register for the event.
CyberOptics Semiconductor announces the release of WaferSense™ Auto Teaching System (ATS) for wirelessly teaching wafer transfer positions
WaferSense ATS is a notable expansion of CyberOptics Semiconductor's lineup of wireless, wafer-like measurement products. ATS employs machine vision to see inside semiconductor equipment and to help avoid costly wafer mishandling, a significant cause of wafer scrap in highly automated semiconductor manufacturing plants. Click here to learn more about WaferSense ATS and other WaferSense products.
EX-QS Wafer Mapping Sensor Available
CyberOptics Semiconductor has released a "small" version of the EX-Q wafer mapping sensor. The EX-QS is the performance equivalent of the EX-Q repackaged to accommodate applications where space is limited or a smaller sensor footprint is desired. The EX-Q and EX-QS sensors detect the dark and thin wafers that can challenge other mappers making them an easy-to-use, high performance replacement. Please contact technical support to determine which sensor is right for your application.
Return on investment: find out how much using WaferSense™ ALS can mean to you in increased uptime and yield.
Think a product should result in positive ROI fast? So do we. Designed to go where wafers go, the wireless, wafer-like WaferSense Auto Leveling Sensor will reduce the time it takes to level semiconductor fabrication equipment. Just how valuable is this timesavings to you? Try our Tool Uptime calculator to find out.